Scientific manager AFM:

FERRI Anthony

Scientific manager SEM:

MATHIEU Christian

Technical manager AFM and SEM:

DA COSTA Antonio


The "Microscopies" platform allows for the observation and characterization of most materials studied within UCCS. The platform is divided between electron microscopy and atomic force microscopy or, more generally, local probe microscopy.

This platform includes a scanning electron microscope enabling the observation of all types of samples (conductive, insulating, or biological) and the identification and quantification of elements present through energy-dispersive X-ray spectroscopy (EDS) or micro-X-ray fluorescence spectroscopy. It also features three local probe microscopes providing access to topography in three-dimensional space as well as certain physical properties of the material (conductivity, magnetism, piezoelectricity, etc.) depending on the probe and the measured interaction, all at the nano-scale.

Access to the equipment is potentially available after individual training and with approval from the scientific and technical managers.